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milstd-883 Datasheet PDF File

For milstd-883 Found Datasheets File :: 256 Search Time::1.735ms
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				INTERSIL[Intersil Corporation]
Part No.	HD1-15531B_883 HD1-15531_883 HD-15531_883 HD-15531883 HD-15531/883 HD1-15531/883
OCR Text	...o surpasses the requirements of MILSTD-1553 by allowing the word length to be programmable (from 2 to 28 data bits). A frame consists of thr...883 can also be used in many party line digital data communications applications, such as a local ar...
Description	CMOS Manchester Encoder-Decoder
File Size	115.99K / 8 Page	View it Online	Download Datasheet

				MICROSEMI[Microsemi Corporation]
Part No.	LX5503-LQ LX5503
OCR Text	... ESD Level 1 in accordance with milstd-883, Method 3015 (HBM) testing. Appropriate ESD procedures should be observed when handling this device. Copyright 2000 Rev. 1.1, 9/16/2002 Microsemi Integrated Products Division 11861 Western ...
Description	InGaP HBT 5-6GHz Power Amplifier
File Size	469.73K / 13 Page	View it Online	Download Datasheet

				List of Unclassifed Manufacturers ETC[ETC]
Part No.	MAX1037EKA
OCR Text	...a transient pulse of 2500V, per milstd-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of 250mA. Table 1 Reliability Evaluation Test Results MAX1037EKA TEST ITEM TE...
Description	PLASTIC ENCAPSULATED DEVICES
File Size	43.74K / 8 Page	View it Online	Download Datasheet

				Maxim Integrated Produc... MAXIM[Maxim Integrated Products]
Part No.	MAX1287EKA
OCR Text	... a transient pulse of 1000V per milstd-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of 200mA. Table 1 Reliability Evaluation Test Results MAX1287EKA TEST ITEM TES...
Description	PLASTIC ENCAPSULATED DEVICES
File Size	89.76K / 8 Page	View it Online	Download Datasheet

				MAXIM - Dallas Semiconductor MAXIM[Maxim Integrated Products]
Part No.	MAX1735EUK
OCR Text	... a transient pulse of 400V, per milstd-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of 250mA and/or 20V. Table 1 Reliability Evaluation Test Results MAX1735EUK T...
Description	PLASTIC ENCAPSULATED DEVICES
File Size	55.55K / 8 Page	View it Online	Download Datasheet

				Maxim Integrated Products, Inc. MAXIM[Maxim Integrated Products]
Part No.	MAX2391EGI
OCR Text	...a transient pulse of <200V, per milstd-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of 250mA. Table 1 Reliability Evaluation Test Results MAX2391EGI TEST ITEM TE...
Description	PLASTIC ENCAPSULATED DEVICES 塑封器件
File Size	109.87K / 8 Page	View it Online	Download Datasheet

				List of Unclassifed Manufacturers ETC[ETC]
Part No.	MAX2682EUT
OCR Text	...a transient pulse of <250V, per milstd-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of 50mA. Table 1 Reliability Evaluation Test Results MAX2682EUT TEST ITEM TES...
Description	PLASTIC ENCAPSULATED DEVICES
File Size	53.55K / 7 Page	View it Online	Download Datasheet

				MAXIM - Dallas Semiconductor ETC[ETC] List of Unclassifed Manufacturers
Part No.	MAX3283EAUT
OCR Text	...a transient pulse of 1000V, per milstd-883 Method 3015 (reference attached ESD Test Circuit). Additionally, the MAX3283E has achieved 15kV ESD protection using both methods 3015 and IEC 801-2 (air-gap discharge) on the I/O pins. Latch-Up te...
Description	PLASTIC ENCAPSULATED DEVICES
File Size	42.31K / 8 Page	View it Online	Download Datasheet

				MAXIM - Dallas Semiconductor MAXIM[Maxim Integrated Products]
Part No.	MAX4007EUT MAX4004EUT
OCR Text	...a transient pulse of 2500V, per milstd-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of 250mA. Table 1 Reliability Evaluation Test Results MAX4007EUT TEST ITEM TES...
Description	PLASTIC ENCAPSULATED DEVICES
File Size	87.71K / 8 Page	View it Online	Download Datasheet

				List of Unclassifed Manufacturers ETC[ETC]
Part No.	MAX4172EXA
OCR Text	... a transient pulse of 400V, per milstd-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of 250mA and/or 20V. Table 1 Reliability Evaluation Test Results MAX4172ExA T...
Description	PLASTIC ENCAPSULATED DEVICES
File Size	115.26K / 9 Page	View it Online	Download Datasheet

For milstd-883 Found Datasheets File :: 256 Search Time::1.735ms
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